Theoretically, it is possible. If you have a good SEM with LaB6 cathode, microscope is well-adjusted and an operator has high skills. But the quality of the pictures will be not very high. The magnification must be about x500 000 - it's near the practical limit for conventional SEM.
I think, TEM and AFM are more suitable methods for visualization of such objects.
It is possible. But it will depend on your composite morphology and its element's also. Try to lower the beam spot size to increase resolution a bit (of course, you tend to loose some info too, so be careful) and keep the optimum working distance so that maximum no. of secondary electrons can hit the detector. Also, stigmatic errors need to be corrected cautiously. With all these clicking together, hopefully you will be able to see MWCNTS. Good Luck.
P.S: I have an 2007 model Tungsten Filament SEM and I do work in CNTs. Have been able to determine their presence with that instrument.