I’m traying to finde how to quantify amorphous phase using Rietveld standard-less method, but nothing is found it always the internal standard or other technic except the standard less method which is used, maybe Rietveld standard-less method can’t be used to quantify amorphous phases? (refining XRD pattern)
Hyvää huomenta! As-Salaam-Alaikum
Take a look at this and let me know if it helps you.
Hello Alan F Rawle
Thanks for your answer
All these amorphous quantification methods require an internal or external standard, I think that a standard is really required for amorphous Rietveld quantification, maybe I should think about peak deconvolution and quantify by peak area, because I have already measured pattern so I must just analyze it.
The same need applies to XRDLB where an internal standard is needed to correct for instrumental broadening.
You just need to measure a 100% crystalline standard sample under the same conditions you used for your real sample (on exactly the same hardware setup). Then you can use the K-factor approach after O'Connor & M.D. Raven.
B.H. O'Connor & M.D. Raven, Application of the Rietveld Refinement Procedure in Assaying Powdered Mixtures, Powder Diffraction (1988), 3, 2–6.
That is pretty straight forward and quite easy to do.
If the amorphous phase has approximately the same scattering power like the crystaline one then you can of course also compare the area of the amorphous hump to the total net area of the crystaline peaks to get a rough indication.
- Badges
- Science method
- Similar topics
- Methodology
- Crystallography
- X-ray Diffraction