is equal The number of X-Ray peaks in XRD and the number of rings in the electron diffraction pattern by TEM for a same polycrystal thin film/powder sample?
The question is not clear. If with XRD you mean an XRPD pattern collected by a classical diffractometer with a point detector and with "number of rings" you refer to the rings observed by an area detector the answer is: for a given compound, using the same wavelength the number of "maxima" is the same in both cases in a fixed interval of teta Bragg angles.
Dear Giovanni ,
my means :
number of rings in the electron diffraction pattern using TEM is equal with The number of X-Ray peaks in XRD ?
For a given range of interplanar spacings (e.g between 10 and 1 Angstrom) the number of diffractions is the same; however, being diffractions intensities quite different for X-rays and electrons the number of very weak diffractions can be different for the two methods. Consequently, the number of observed peaks/rings may differ. Likely you can expect less X-ray peaks.
Dear Profossor,
if our sample be thin fim (thickness of thin fim in order x-ray wavelength) , so number of rings in the electron diffraction pattern using TEM is equal with The number of X-Ray peaks in XRD?
If you are measuring the same range of Q space, then the number of hkl rings will be the same. However, it is doubtful that you are measuring the same range of Q space with both x-rays and electrons, unless you are using extremely high energy x-rays and a large area detector.
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