1) In XRD analysis, while testing Thinfilm for information on the crystallinity of a particular thin film at the sample holder, if we used epoxy plaster tape to keep the thin film tight in that holder, did that impact the samples' properties?
2) If epoxy plaster tape is amorphous material in the above case, then?
3) If epoxy plaster tape is not amorphous in the above case, then?
Dear P. Maheswar Reddy ,
three points:
a) please have a look at epoxy XRD; for example Fig. 5 of:
Article A New Filler for Epoxy Resin: Study on the Properties of Gra...
If your epoxy contributes to your background, you will be in trouble because of the broad XRD 'peaks', as you mentioned above.
As Vadim S. Gorshkov
suggested, acquisition of an epoxy pattern could help, but you have to perform a weighted subtraction of sample XRD and the epoxy XRD pattern; but weighting factor unknown yet.So
b) what thickness range of the film you are talking about? (When putting a film onto 'a plaster tape', I assume, it should be quite stiff and thus will have not too low thickness).
c) depending on the thickness range you may use grazing incidence XRD (GIXRD), which will reduce the information depth of XRD.
Best regards
G.M.
Epoxy it self have broad XRD peak near the 20 (2theta) position. Additionally, actual XRD intensity of of your thin film sample may be affected with epoxy tape. But if you don't have other option for measurements, then still you can go through epoxy tape.
First record the XRD of the your epoxy tape. After that record the sample with this tape. Later you can compare or substrate the epoxy XRD data from the your sample with epoxy tape data.
Anyway, epoxy tape have only one peak at 20 so if your thin film is crystalline then if will not affect too much.
Good Luck
You can also use the clay to keep the thin film tight in the holder, but this will result in a crystalline peak of clay as well. Lastly, you must eliminate that exact peak manually.
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