I wanted to take tem images of my magnetic nanoparticles prepared using iron. It has a magnetic susceptibility below 10 emu/g. Whether this will interfere with the electromagnetic lenses of TEM and hinder the production of image
Theory of TEM system suggests that the magnetic coils are used to control and confine electron beam....but the magnetic field strength of those fields and field created by magnetic material as thin sample arr very much different....as such magnetic field will become effect...then and then only if field is making some angle with beam...hence there are very low scope for such interference.