I also want his or her contribution in analysis. I want a collaborative work.
Dear Ayan How can help you? What are kind of materials need to measure the FESEM and TEM?
I have undoped and several doped CdS thin film . I want ur help for measurement
As you are near to IIT Kharagpur, I would recommend you to to use our central research facility for FESEM and TEM testing.
Dear Ayan, because you have inorganic material like CdS, therefore must be coated first by one of conductive metals. The FESEM microstructure analysis was performed using two types of imaging signals – back-scattered electrons (BSE) and secondary electrons (SE). Sample preparation was identical to that used for microstructural characterization.The samples were embedded, in order to have the appropriate electric contact between the sample (cathode) and the FESEM table (anode). Energy Dispersive X-ray (EDX) analysis with FESEM technique was also performed in order to investigate the elements present at the coating layers. For your information, this technique can be measured coating layers with thick substrate. While the technique of TEM, must be done to prepare a samples of one micron thickness approximately for the examination.
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