Is that because my thin film is dark?
I prepared in the same way and measured succsefully Iron oxide, SnO, Indium, Copper, Tungsten and Alluminium thin film.
but somehow I cannot use it on Nickle nitride, and pure zerovalent iron thin film. The machine cannot recognize it, we tried to change the mode into fixed it didnt worked.
is this because my material is dark?
What is the expected thickness of your films? If they are more then, let say 40 nm (for some even 30 nm) thick, you can’t measure the thickness. There is no light going out, so you don’t have what to measure.
I didn’t understan „the machine cannot recognize it“.
Well I expect to be the same as with the one of Oxide. Nickle oxide and Iron oxide no problem,
but Pure Nikle/NickleNitride and pure Iron cannot be even detected, like they are not there,
usually I would get some respose as I got with Aluminium, Indium, W..
It means that we get from machine following message
could not locate beam Sample height alligment failed...
so then we try with fixing the sample, but errors and SD are so high
is your film very dark so that the reflected light intensity is very low?
is your film very dark so that the reflected light intensity is very low
Is your film very dark so that the reflected light intensity is very low
Well, you say that you expect similar thicknesses as with the other materials. But how thick were the films?
So, Olivera Stepanović already answered your question. The films are too thick, hence not transparent enough to receive a reflected light intensity. Of course the critical thickness will differ from material to material.
do you think it is not related with Nickel and Iron being dark?
how can I find info about critical thickness?
why Oxides of nickel and iron can be measured but pure elemets and nitride cannot?
Well, what is the main difference between metals and their oxides? Conductivity and crystal structure. Many oxide films have an amorphous structure and are hence more transparent. If you want to determine the thickness of your films, you will have to use other methods. One possibility is X-ray reflectometry. However, films of about a few hundred nanometers can also be visualized in scanning electron microscopy, if you manage to prepare the films on glass substrate and break them properly.
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