Applications_Library/Memory/SONOS_Memory
I want to put the MSC Hydrogen degradation model into the SONONS structure.
How do I input and run the trap model and hydrogen diffusion model together in the nitride physics?
I want hydrogen to diffuse from nitride to oxide.
Please help.
Dear Zhenguang Jin,
You may want to review the data below:
Modeling and Characterization of Hydrogen-Induced Charge Loss in Nitride-Trapping Memory
In fact, it is widely accepted that hydrogen affects the reliability of the memory device via the generation of positive charges or interface trapped charges [11,12]. E.g., the positive charge in the oxide reacts with H 2 or atomic hydrogen to create H + ions [13,14], and the H + ions could easily drift from tunnel oxide to the tunnel oxide/Si interface to break Si-H bonds under positive gate bias in program-state, and thereby, generate interface traps. And the dissociative H + and the generated interface traps could work as main contributors to capture and neutralize electrons injected from the channel of MOSFET, which brings about the elimination of effectively stored charges in Oxynitride layer, and the stored charge loss induces the V TP degradation, and ultimately cause sort test failure. ...
https://www.researchgate.net/publication/3075417_Modeling_and_Characterization_of_Hydrogen-Induced_Charge_Loss_in_Nitride-Trapping_Memory/citations
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Simulation of a hydrogen permeation test on a multilayer membrane
To understand a metal susceptibility to Hydrogen Embrittlement (HE), it is important to quantify the diffusion of hydrogen through a metallic membrane. However the parameters directly accessible from electrochemical permeation experiments are the time required for a stream to be observed and the flux saturation corresponding to a steady state. The literature offers different models to obtain the diffusion coefficient from these curves. But this diffusion coefficient is not that of the membrane alone because it also takes into account the surface state and the kinetics of trapping. For some thicknesses of membrane and surface coatings (oxide) this approximation cannot be considered fair. We propose to simulate numerically the influence of the oxide thickness on the effective diffusion coefficient taking into account the trapped hydrogen.
https://www.comsol.ru/paper/download/63090/bouhattate_paper.pdf?ysclid=lczgchwtvq429580513
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Numerical Study of Hydrogen Trapping: Application to an API 5L X60 Steel
A numerical finite difference method is developed here to solve the diffusion equation for hydrogen in presence of trapping sites. A feature of our software is that an optimization of diffusion and trapping parameters is achieved via a non linear least squares fit. On the other hand, we have demonstrated that usual electrochemical hydrogen permeation tests are enough to assess hydrogen free energies of trapping in the range of −35 kJ/mol to −70 kJ/mol. These conclusions are obtained by assuming the presence of saturable traps in local equilibrium with hydrogen and are validated by means of simulated permeation and degassing transients. In addition, we check our model performing electrochemical hydrogen permeation tests at 30°C, 50°C, and 70°C, on an API 5L X60 as received steel state to study its trapping and diffusion properties considering only one type of trapping site. The binding energies () and the trap densities () are determined by fitting the theoretical model to the experimental permeation data. The steel presents a high density of weak traps, KJ/mol, namely, mol cm−3. Strong trapping sites which alter the shape of the permeation transient are also detected; their values ranged from 57 to 72 KJ/mol.
https://www.hindawi.com/journals/isrn/2012/945235/
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