I deposited TiO2 thin film on Si substrate. Substrate was etched to remove Silicon oxide layer before deposition but it develops oxide layer as soon as it is exposed to air. I need to have CV measurements of the sample which has TiO2 thin film on one side of Si substrate and Silicon oxide on the other side. in order to study it for CV measurements I need to deposit gold film on both sides but the main issue is to remove oxide layer. Can any one suggest some quick and east way to remove oxide layer from the Si wafer without damaging TiO2 thin film