• we use (Tridecafluoro-1,1,2,2-tetrahydrooctyl)trichlorosilane; 97% from abcr
  • evaporation silanization was performed in an exsiccator which has been flushed with Ar prior to evacuation to drive out humidity | duration: 30 min | pressure: < 5 mbar | silane volume used: 40 µl
  • the unwanted silane cross-linking was likely induced by humidity either in the exsiccator or in the silane bottle itself
  • the pattern the Si wafer carries is an etched one
  • I know that oxygen plasma should be able to remove the silane, but will it leave the patterend Si wafer unaffected? Will it also clean thoroughly within the channels of the pattern? Are there alternative ways?
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