Dear Researchers

XRD measurements were carried out using Bruker D8 Advance X-ray diffractometer. The x-rays were produced using a sealed tube and the wavelength of x-ray was 0.154 nm (Cu K-alpha). The x-rays were detected using a fast counting detector based on Silicon strip technology (Bruker LynxEye dtector).

I obtained the result in UXD. file format. Please help me regarding any software to open it.

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