I am trying to model interface traps of TFET using Sdevice sentaurus tool. I build the strucutre using structure editor and then I used sdevice to simulate the current. But the results have some errors in traps interfaces as
((Unable to save dataset 'TrapOccupation_0(hN,Un)':
interface 'gateoxide2/channelregion' not found in grid file sdemodel_msh.tdr ! ))
Could anyone who model interface traps provide me with working example of traps models without errors?
Amira Nabil greetings .
I encountered this error myself , one technique to go around it is to impose a "fine" auxiliary mesh . I am trying to implement it myself.
this technique has been reported in "Rezaidi Houssin" PhD thesis from Glasgow university, "A statistical study of time dependent reliability degradation of nanoscale MOSFET devices" unfortunately no scripts were included. (go to Statistical Reliability Simulation section in the attached file)
I highly recommend reading his work.
Dear Amira Nabil and Ali Houadef
I had the same problem,
I resolved it by inserting a snmesh tool between the sde and the sdevice tools with this command file :
IOControls {
EnableSections
InputFile="n@node|sde@_msh.tdr"
OutputFile="n@node@_msh.tdr"
}
Tools {
addInterfaceRegions
}
Then, in the file section of the sdevice command file i replaced the "Grid" line by :
Grid = "n@node|snmesh@_msh.tdr"
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