The P3HT:PCBM thin film is spin coated on a silicon substrate. The thickness of which is unknown. After that, The silver contacts of 200nm thickness are RF sputtered on the film by a mask. The question is that which testing method could be used to measure the electrical conductivity of P3HT:PCBM. Potentiostat equipment and solar measurement equipment is available only. The film is very thin (in nanometer range) so please suggest accordingly.
Thanks in advance.
Dawar Ali
The normal route to measure thin film resistivity (rather than conductance) is the four-point probe measurement. See (for example): https://en.wikipedia.org/wiki/Sheet_resistance
This has also been answered previously on RG but no-one seems to conduct a search there:
https://www.researchgate.net/post/How-to-calculate-thin-film-conductivity
https://www.researchgate.net/post/How_can_I_measure_the_electrical_conductivity_of_thin_film
https://www.researchgate.net/post/Why_do_posters_of_questions_on_RG_not_search_the_platform_first
Dear Dawar Ali ;
The electrical resistance of coated thin films can be measured using the Loresta resistivity meter, model MCP T400, from Mitsubishi. This device measures the thin film’s sheet electrical resistance, and then, the thin film thickness can be calculated using these measurements. The device consists of four-point tungsten probes. The electrical resistance was measured by contacting the four probes on the surface. more details in the following reference;
Article Effective Parameter of Nano-CuO Coating on CO Gas-Sensing Pe...
- https://www.pveducation.org/pvcdrom/characterisation/four-point-probe-resistivity-measurements
Dear Dawar Ali,
For to measure the electrical conductivity of the thin film, the following steps must be followed :
1) The measurement of the electrical sheet resistance of the thin film by the four-point technic.
2) The thickness of the thin film can be calculated using cross-sectional SEM or by a profilometer or your measurement.
3) The electrical resistivity of thin films is deduced from their thickness and resistance measured by the contacts of four points on their surface.
4) Finally, the measurement of the electrical conductivity of the thin P3HT: PCBM film is deduced from their electrical resistivity. More details in the following reference ;
(PDF) Opto-electrical properties of Ni and Mg co-doped CdS thin films prepared by spin coating technique (researchgate.net).
Mesure 4 pointes — Wikipédia (wikipedia.org).
Electrical conductivity and Sheet resistance can be obtained by Four Probe meter in a feasible way.
Dear Pavar Sai kumar ,
Electrical Sheet resistance can be obtained by a Four Probe meter feasibly. However, Electrical conductivity cannot be found directly par four-point method.
On the other hand, from the calculation of the electrical sheet resistance and thickness of the thin films investigated, it can be calculated the electrical resistivity, and finally, it can be deduced the electrical conductivity because the electrical conductivity equals the reverse of the electrical resistivity.
Thank You El Mahdi Bouabdalli for correcting,
Ossila Four Probe meter, Here in this instrument we can get Electrical conductivity also.
Just for reference attaching Fig. obtained using Ossila.
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