I want to measure sheet resistance of thin film.
when I measure the resistance by multimeter, it shows 0L (??).
can I measure its surface resistance?
secondly, I have confusion, that which dimension I should consider as a length an which one as width? can I choose arbitrarily ?
Thank you
Measurement with a multimeter wont give reliable measurement. "OL" means data is out of maximum range. You can still measure the sheet resistance by using four probe technique. But need to have the geometrical correction factor. You can also go to this link below.
http://www2.ece.gatech.edu/research/labs/vc/theory/sheetRes.html
Please make sure that your film is continuous and check the compliance voltage set in your current source. If your sample resistance is too high try to use lowest possible current and higher compliance voltage.
When you try to pass the current between contacts your current source creates voltage difference between the contacts to force the set current. If your sample resistance is very high means you should increase the set compliance voltage, so that your current source will be able to force the current. V compliance is the max potential difference it can create between your contacts.
"Compliance voltage is the maximum voltage a current source will go to in its attempt to source the programmed current. Compliance voltage values are user settable, allowing complete control over the sourcing and measurement process"
I don't know the details about your current source. Please go through the manual of the current source.
For high resistance samples you can use electrometer or sourcemeter . four probe technique not required for high resistance samples.
- Badges
- Science topic
- Similar topics
- Chemistry
- Nanotechnology
- Nanostructures
- Thin Films