Dear Jitesh Pandya ,

If you have glass substrate which is an insulator you can exploit the conduction properties of the ZnO to identify it. So, if the surface is more conductive than the bare glass then it is very probable that some ZnO layer has been deposited.

Best wishes

Dear Jitesh Pandya ,

If you have glass substrate which is an insulator you can exploit the conduction properties of the ZnO to identify it. So, if the surface is more conductive than the bare glass then it is very probable that some ZnO layer has been deposited.

Best wishes

Interested.

Hello Jitesh Pandya,

A simple analysis is to measure the transmission spectra of the substrate without and with the deposited film. Changes in the transmission data are an argument to confirm its presence.

Optical microscopy can be a powerful tool to see particles, cracks, and others, a good film deposition can be evaluated using several techniques, such as FTIR, Raman, and atomic force microscopy (AFM).

Another sol-gel user tip: Using sol-gel process you can deposit the film without having the nanoparticles first, through dip-coating or spin-coating methods, which are very easy to use.

Regards,

Gustavo.

Dear Pandya,

you simple take transmission spectra with the help of UV- VIS spectroscopy .

if you ZnO film deposited than you simple observe significant change in transmission spectra .

For more information read the following paper .

I may be incorrect as well but I just scratch the small portion of the coated side and may see something coming out of it. But may not work during the making of ETL

Please use FE-SEM for cutting edge of sample. You can see the the side view of the layers.

Dear Jitesh:

I don't know how thin the ZnO film you have deposited is. If this ZnO coating is crystalline, with the GIXRD technique (grazing incidence X-ray diffraction), it should be able to verify the presence of ZnO with the corresponding peaks in the diffractogram. This technique is very fast and non-destructive.