It looks very simple to use the following relation:
d=L*Lambda/r
d diffraction distane of hkl plane
where L is the camera length (should be calibrated using reference material)
Lambda is the electron wavelength at a working electron accelrating voltage (can ce calculated or experimental which is recommanded)
r:direct measurement on the SAED between one diffraction dot and the central beam or to minimize the errors between 2 dots in that case you get 2r
alos check the bibliography of Oberlin Agnes who published several paper on
Also the book on Transmission Electron Microscopy by Carter tome 2 is a reference book on SAED techniques and more
Calculations are reliable as soon as your TEM is perfectly configured and all the working parameters checked and certified by operators
- Badges
- Science topic
- Similar topics
- Physical Sciences
- Materials Science
- Material Characterization