Dear saitanya,

You know the wavelength of X-ray used. You have 2theta values from the observed data. Find out d values using Bragg condition. Using the d values you can index the pattern to know about the crystal system and lattice parameters.

Without knowdege of your chemical composition it is difficult to find out on the basis of such a pattern. However, the peak at 24.16° strongly looks like a diffraction band/Warren peak from a strong layer faulted structure. Then the peak at 10° could correspond to a basal plane reflection. Note that databases (icdd) or patterns simulated by conventional software based from the periodic crystal structure will not contain this feature. Hence, if you have a candidate structure from chemical composition you may have to analyse the candididate structure model whether it is prone to layer faulting. Perhaps this helps.