Dislocation density may estimated based on the peak broadening of XRD pattern using conventional Williamson-Smallman equation. More advanced technique is introduced by Prof. Matteo Leoni using WPPM technique. large number of data of the scanned pattern must be obtained ( long time of scanning). you can find more about this by using google search. A good software must be used such as Topas , HSP. The most important thing is to correct the instrumental broadening.