Dear all,
I am modeling the OFET electrical characteristics using Synopsys TCAD. I want to define the surface roughness of organic semiconductor layer.
Can anyone help me regarding this?
please suggest me any other experiment (if necessary, other than optical spectra) to identify direct or indirect semiconductor material ?
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Dear all, I am modeling electrical characteristics of CuPc based OFET. I want to know the density-of-states present in bulk CuPc semiconductor layer.
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Usually, additive manufacturing techniques like SEBM, SLS, and SLM are used for interconnected porous lattice structure generation with sizes of >100–200 micrometers. Can the Fused Deposition...
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