If you know the crystal structure, you may calculate the lattice spacing of low indexed planes and compare with your measured value.
for example, you can use free software PTCLab to calculate the d spacing of a crystal structure (e.g. Al), and get the d list corresponding to different g vectors by clicking "show g list", as showing in the attached file.
Yes, as prof. Xinfu Gu mentioned above, the values of the spacing value d can be calculated from TEM by using software PTCLab. But still ( h,k,l ) unknow!! How can obtain them from TEM data.
If you have XRD for your sample, from the value of the d spacing you can compare it with the similar one you got from XRD and then XRD will give you their indexing.
I have recently checked the structure of a specimen via HRTEM (the attached images).
First, the electron diffraction shows single crystal (Figure a).
Then, in figure b, I found different d-spacing. I expected the same d-spacing for such a electron diffraction as Figure a . !!!
Another question for me is:
In comparison with XRD pattern with (hkl)=(013) as the most intense peak, the d-spacing that is mainly appeared in the HRTEM refers to (hkl)=(110). I expected similar reflection pattern to have d-spacing related to (013) as majority also in TEM graphs!!! why it is that?
You need TEM and XRD to get the indexing, you can get the d from TEM and then index your TEM image by comparing the d value from it with the similar one from XRD.
For the difference between diffraction pattern and HRTEM image, the HRTEM image is formed by phase contrast, it is expected the spacing could be larger than that calculated from diffraction pattern.
In fact the deviation of d-spacing values is not my question. The subject that I am a little bit confused with is the simultaneous appearance of those different d-spacing (different arrays of crystal planes) values in the HR-TEM with no sign of orientation as selected-area electron diffraction shows the pattern of single crystal. As I have understood, it won't violate the single crystal features. But, I expected in the case of different d-spacing in the HR-TEM, there be some rotations and deviations from single crystal electron diffraction. Is my thought correct?
Should we say, HR-TEM illustrates the most outer crystal planes, while electron diffraction is the pattern of crystal planes within a few nano-meter thickness of particles?