For example in situations where the sample is placed in diamond anvil cell or in a case where the powder is sandwiched in some holder and the data is being collected on an image plate. Any situation away from the ideal glass capillary scenario where estimate of absorption correction can be made for a given wavelength.
I think the thickness of the sample is not the relevent parameter for you. It should be the product of linear attenuation coefficient µ and thickness d : µ*d (you havn't got either a real trustable number for µ I guess).
You can have access to that number by two measurements (taking the non-deflected x-ray beam):
Anvill cell without sample ---> Io
and anvill cell including sample: ---> I
The relation is: I = Io*exp(-µ*d); ---> µ*d = ln(Io/I)
Dear Prachi,
I do not know whether your expectations with respect to transmission/absorption correction can be satisfied for your set up at all.
You should try to model your x-ray beam path(s) and take advantage of non-deviated x-ray beam Itr passing the sample, including for example the holder.
Itr = Io *exp(-µ*d)*Tholder; Tholder = transmission of holder to be calculated from geometry data and material attenuation or measured separately without sample.
Io is the primary photon flux without sample. Due to high primary photon flux, it could be worthwhile to measure Io via separate known filter and/or you may reduce mAs and rescale measured flux value accordingly.
From known values of Io, Itr and Tholder you get your µ*d of the sample.
With this µ*d you should be able to correct the angular and absorption dependence of all other x-ray beams when geometry and attenuation coefficients of the surroundings are known.
Dear Gerhard,
Thanks for the answer. However I am not sure how to calculate d inside a diamond anvill pressure cell when I am filling an arbitrary amount of sample and have no way to quantify the thickness.
I think the thickness of the sample is not the relevent parameter for you. It should be the product of linear attenuation coefficient µ and thickness d : µ*d (you havn't got either a real trustable number for µ I guess).
You can have access to that number by two measurements (taking the non-deflected x-ray beam):
Anvill cell without sample ---> Io
and anvill cell including sample: ---> I
The relation is: I = Io*exp(-µ*d); ---> µ*d = ln(Io/I)
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