I need to extract the surface roughness values using Atomic Force Microscope. I have taken different images using AFM. Using Line profile analysis I can only calculate the roughness in a line scale. Is It possible to find out the average roughness value of the sample with AFM?
You can ask Volodymyr Kuznetsov from Ruhr-Universität Bochum
(http://www.ruhr-uni-bochum.de/elan/Staff.html)
e-mail: [email protected]
Many parameters can be used in order to calculate roughness. Which ones to use depend on exactly what you are looking for: deviation from mean height, valley quantification, peak quantification, symetry... The clasic roughness parameters are Ra and RMS, though. It should be a good place to start.
I found this document particularly clarifying. It explains the different parameters which can be used to analyze a height image. As for the parameter calculation, I would definitely try Gwyddion. It's a powerful and intuitive software, as well as free!
How to analyze a AFM image? Can I get some experts advice in this regard? - I think all AFM systems got some kind of software which let to make analysis. Gwyddion is great, but other freeware is WSxM - nanotec.es
The surface roughness is calculated using the equations for the average roughness and the mean square root roughness please read:
Birdeanu Mihaela, Fagadar-Cosma Eugenia
Chapter 5: The Self-Assembly of Porphyrin Derivatives into 2D and 3D Architectures
in
Quantum Nanosystems: Structure, Properties and Interactions, Apple Academics Press, Toronto-New Jersey, ISBN: 978-1-926895-90-1, 2014, pp.173-206,
§URL: http://www.appleacademicpress.com/title.php?id=9781926895901
CRC Press Taylor & Francis Group
According to the current standards, the roughness is considered to be a third degree geometric deviation (when it has a periodical or pseudoperiodical character: striations, thread patterns), or a fourth degree (when it has a non-periodical character: material pulling, patterns, voids, pores, etc.).
Regarding the roughness, the problem is twofold: (1) the scan and (2) the data treatment. Whatever the mathematical model used to calculate the roughness, the data treatment will be limited to what is available from the scan. One of the weak points is the limitation in the spatial resolution due to the radius of the tip. Ideally use sharp tips with small radius and scan using conditions that help preventing tip blunting.
Dear Gokul Raja,
AFM has many parameters like Amplitude, Statistical and Spatial parameters to describe the surface topography. Even by line profile, 3D and 2D image profile and Histogram analysis, you can explain sizes and counting rate of the domains of the materials and surface morphology.
The Statistical parameter like coefficient of kurtosis and skewness describe asymmetry and flatness of the surface. Spatial parameter like entropy and Redundance describe morphology connecting with the degree of order or disorder in the grain structure distribution. Depth profile of the multilayer films can also measure by AFM technique.
Use free downloadable software gwyddion. You may analyse the data by this software. You can get all your answers through this one.
T. S. Gokul Raja Eugenia Fagadar-Cosma Sajad Hussain Deen Louise Deschênes
Can any one tell me how to analysis SEM image by software like as height and roughness ?
I would recommend this 3 papers from Gwyddion creators:
How levelling and scan line corrections ruin roughness measurement and how to prevent it
David Nečas, Miroslav Valtr and Petr Klapetek
Scientific Reports 10 (2020) 15294
DOI: 10.1038/s41598-020-72171-8
Estimation of roughness measurement bias originating from background subtraction
David Nečas, Petr Klapetek and Miroslav Valtr
Measurement Science and Technology 31 (2020) 094010
DOI: 10.1088/1361-6501/ab8993
Study of user influence in routine SPM data processing
David Nečas and Petr Klapetek
Measurement Science and Technology 27 (2017) 034014
DOI: 10.1088/1361-6501/28/3/034014
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