I would like to quantify the ratio among the atoms present on the surface of my material. I have tried EDX but it gave very odd results even for my starting material which was a purchased product. I am hoping XPS will be much more accurate than EDX in my case. I want to quantify V and O atom %
In the ideal case, both should yield similar results. Depending on your sample (e.g: thin film vs. thick film) and other experimental parameters, however, they may look very different.
As for your question on XPS accuracy, it would depend on how accurate your XPS analysis is (e.g: using the correct atomic sensitivity factor, calibration to C 1s, etc) to the reality. You might want to look into ICP-MS as an option to cross-check your elemental analysis.
They may look very different.
it depends on your sample (thin film - thick film) and other experimental parameters.
^I actually want to know the atomic percentages on the surface of my material. My material has a thickness around 70-100 nm and my samples film is quite thick around (0.5 mm approx) on carbon tape.
Ali Asghar Javidparvar
: Do you have to post this link under every XPS discussion here on RG? I mean, it is a nice beginner's introduction, but for most discussions under which you posted it it's not detailed enough [plus, look at the age of this discussion, it's 2017].- Badges
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