I have taken SAED pattern of my Titania sample. It is showing that the sample is polycrystalline with clear boundaries. I calculated d-spaces using Image-J, but the d-spaces values are not matching with the XRD pattern? I attached the electron diffraction images below. Could you suggest me how to calculate or how to match d values with XRD?
In the above pictures i have calculated the d spaces, the d values of the polycrystalline rings are not matching with XRD values. Please suggests any articles or books to refer in detail about SAED calculation.
In the above pictures i have calculated the d spaces, the d values of the polycrystalline rings are not matching with XRD values. Please suggests any articles or books to refer in detail about SAED calculation.
Dear Manjunath
I am attaching a file, describing step-by-step the procedure to find inter-planar distance (d) values from SAED patter. An arror of +-0.02 nm can be considered in d values.I hope It helps you.
Also see the link: http://www.matter.org.uk/diffraction/electron/electron_diffraction.htm
Its encouraging to see that the scientists are united to solve their problem.
The attached doc and pdf files are really nice for the beginners.
Its very nice & commonly useful information for calculating d-spacing. Knowledge should be shared for inovative research.
The interpretation and indexing of spot patterns from single - crystal are nearly always carried out using the concept of the reciprocal lattice originally by Ewald and Von Laue. The reciprocal lattice is one composed of a system of points , each of which represents a reflecting plane in the crystal and has the same indices as the corresponding reflecting plane.
dr = Camera constant . R it is easy to measure directly from the phtographic plate and once r is indexed , camera constant can be established . This is not eadsy to do if bthe structure is not Known . The Camera Constant will also vary with the lens current used so that camera constant must be worked out of each pattern that is obtained .
Once Camera Constant is known for the microscope the diffraction patterns may quickly indexed simply by dividing Camera Constant with the measured distances r of the spots from the origin in this way d- spacings are obtained directly .
For easy and effective SAED calculations you can explore this link,
http://www.instanano.com/characterization/d-value-calculation/saed-d-value-calculation/
Dear All,
Is it also applicable for crystalline hexagonal material? For example, if we look into SAED pattern of graphene, how does one can estimate its d value? and how one can calculate its lattice parameters a,b and c
I have SAED pattern without scale. how can i estimate the corresponding planes??
I have SAED pattern without scale. how can i estimate the corresponding planes??
Dear Manjunath
I suggest you consulting Dr. Sidnei PaciorniK of the Pontificia Universidade Catolica do Rio de Janeiro, who is an international expert on this topic. He is in Research Gate. Best Regards.
Dear Manjunath,
Take the raw image of Selected Area Electron Diffraction (SAED) from Transmission Electron Microscope (TEM). Then use following expression to calculate the d-spacing.
d value calculation:
Distance between two bright spots (D) = 2 × Radius of that circle
The distance is in reciprocal space so we take inverse to convert it into real space
Thus, the formula for Interplanar spacing (d):
Interplanar spacing (d) = 2 / Distance between two bright spots
Hope this information will be help you.
Best Wishes!.
Hi, Manjunath,
Please refer to the following paper. It gives you enough information to analyze SAED patterns. Specifically, check the supplementary information for detailed calculations.
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