I have grown a thin film by R.F Magnetron Sputtering and get it XRD done and now all i am getting is substrate(MgO) peaks more peculiary as the film is only 20-30 nm thin.Is there any way i can only get my material peaks instead of substrate peaks?
Substrate diffraction pattern can be scaled to account for X-ray absorption in the thin layer, and then subtracted from the layer + substrate pattern. As a result, the substrate peaks are eliminated.