XRD can determine the crystal structure of the materials based on the diffraction of the X-ray beam, each material has its own arrangement of crystals, giving the uniques cyrtsal structure. Based on some calculation from XRD, the materials can inherit specfic stress or strain. On the other hand, the texture is something which can be only for the morphological prperties, same materials having specific or the same crystal structure, can be smooth or rough in texture. The texture can be determined by any surface techniques starting from optical or scanning electron microscopy, etc..
Yes, we can calculate strain from XRD. First you fit all the peaks in XRD data with Gaussian distribution function and calculate FWHM of each peak with its 2-theta values. Then you can use Williams Hall expression to draw the graph. Plot looks like a linear curve. From its fitting you can easily calculate strain in material. Here is one reference which may help you in calculations.
Ref.: dx.doi.org/10.1021/jp4029479 | J. Phys. Chem. C 2013, 117, 18666−18674
@ Edward: Yes. To calculate FWHM of each peak in XRD, we can use Gaussian distribution function.
Maybe this paper will be of some help: Lutterotti et al. Texture, residual stress and structural analysis of thin films using a combined X-ray analysis. Thin Solid Films 450 (2004) 34–41. doi:10.1016/j.tsf.2003.10.150
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