Hi Khagendra,

you'll be facing two major problems to quantify your results: the lateral spring constant [N/deg] and sensitivity [deg/Volt]. To my knowledge, the Sader method is currently most frequently used to calculate the lateral spring constant. Main source of error are the physical dimensions of your probe, so you should either measure their optically or (if available) by SEM. Influences of the spherical tip are taken into account when measuring the lateral thermal noise spectrum. The lateral sensitivity is more delicate. You have to perform some sliding measurement, where the tip stays in fixed contact with the surface at some point (similar to calibration of the vertical sensitivity). Some groups were successful using sharp step edges and low sliding velocities. Others use the reverse point (trace/retrace). One has to discuss thoroughly, whether the tip really stays in fixed contact with the surface here.

Good luck!

Manuel

http://www.ampc.ms.unimelb.edu.au/afm/calibration.html

Article Lateral Force Calibration: Accurate Procedures for Colloidal...

Article Prototype cantilevers for quantitative lateral force microscopy

Data (Science) Frictional Chacteristics of Atomically Thin Sheets(SOM)

Hi Khagendra,

I would add two informations to Manuel's response. 1) You don't need to determine the lateral spring constant. Instead you can apply a reference method; example: A.J. Kulik et al., Beilstein J. Nanotechnol. 2015, 6, 1164–1175. 2) The application of a triangular-shaped cantilever for lateral measurements is not a good idea. Rectangular cantilevers are much more sensitive for lateral forces.

Best regards,

Arek

http://tx.technion.ac.il/~merei02/public/varenberg%201.pdf

An improved wedge calibration method for lateral force in atomic

force microscopy

M. Varenberg, I. Etsion,a) and G. Halperin

Thanks for you all. I will go through your suggestions.

you may use calibration grating such as TGF-11. This method is free from the cantilever dimensions.