In order to simulate the noise in any device structure including your device, you need to model it in its equivalent circuit. Then you can assign the noise sources to the elements of the equivalent circuit issuing noise such as the resistors and the current sources. The resistors issue thermal noise and the current sources issues shot noise.
The spice models of the devices already have noise models and you can use them. Conceptually you have to build a noise equivalent circuit to your device.
Then it will be easy after that to calculate the equivalent noise source of the device.
I think you have to use the conversion tool from TCAD to SPICE to build such noise equivalent circuit.
https://www.synopsys.com/silicon/tcad.html
I did not work with such software but I give you here a conceptual answer that may help you solve your problem.
In order to simulate the noise in any device structure including your device, you need to model it in its equivalent circuit. Then you can assign the noise sources to the elements of the equivalent circuit issuing noise such as the resistors and the current sources. The resistors issue thermal noise and the current sources issues shot noise.
The spice models of the devices already have noise models and you can use them. Conceptually you have to build a noise equivalent circuit to your device.
Then it will be easy after that to calculate the equivalent noise source of the device.
I think you have to use the conversion tool from TCAD to SPICE to build such noise equivalent circuit.
https://www.synopsys.com/silicon/tcad.html
I did not work with such software but I give you here a conceptual answer that may help you solve your problem.
Simulation of noises requires a set of tools to model quantum phenomena which usually are not included in the main part of device simulation softwares. To understand the capabilities of your device simulation software, you can perform the simulations more than once and compare the results. The answers are almost always the same. In a conventional device simulation software, the noise is not calculated because the answers remain the same. The way I know to overcome this common problem is to use Monte Carlo simulation. This is not an easy way but being able to use this powerful tool can make you a high class device engineer.
Wish you good luck. Also, the suggestion regarding the circuit simulation needs some attention because as far as I know it is not easy to model a pinned photodiode (Analytical Modeling of Pinning Process in Pinned Photodiodes, DOI: 10.1109/TED.2018.2862251). Thus, either you improve the present models or you can simplify the pinned photodiode as a simple photodiode.
Dear Hamzeh Alaibakhsh and Professor Abdelhalim abdelnaby Zekry ,
Thanks for answering at first, I have worked out this problem recently. Sentaurus TCAD software supports users to set up trap model freely, including the concentration and location. Additionally, Noise section can be employed to invoke trap model we defined previously. Thus, we can obtained the plot of noise power spectral density (NPSD). Finally, by integrating the frequency, we can calculate the flicker noise caused by traps in the interface by means of conversion gain.
Your methods have helped me to understand the problem in terms of circuit analysis, wish to discuss and study with you in the future.