Hello,

I am currently working on the estimation of the electromigration of an FPGA.

We just performed the construction analysis so we know all the values of wire width and height for each metal line. From the data sheet, we also know the current consumption of the device.

We would like to estimate the electromigration lifetime for each metal line. In order to do so, I need to know the current density. Any idea how can I (roughly) estimate it, with the data I have available?

Thanks a lot

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