In order to verify the epitaxial nature of the thin films, one can perform a phi scan. The distribution of a certain omega-2theta peak along phi will be indicative of the two-dimensional crystallographic symmetry of the surface. For example, in an epitaxial film with a wurtzite crystal structure, (110) reflections must be observed every 60 degrees along phi.
A phi scan is performed by rotating the sample 360 degrees, and observing the changes of intensity. My question is how to do this on a Discover D8 machine, what software to use, and how to integrate along phi?
Mr./Mrs/Miss Motamedi,
Softwares for powder XRD using Discover D8 of Bruker are
PILOT: instrumental set-up software
DIFFRACplus: file conversion and data processing
The manuals are available at: www.bruker.com
Thank you Ms. Ivanova. I have been going through the manuals of almost every piece of software available to my XRD lab. I specifically cannot find information on this type of scan.
- Badges
- Science method
- Similar topics
- Methodology
- Crystallography
- X-ray Diffraction