In order to verify the epitaxial nature of the thin films, one can perform a phi scan. The distribution of a certain omega-2theta peak along phi will be indicative of the two-dimensional crystallographic symmetry of the surface. For example, in an epitaxial film with a wurtzite crystal structure, (110) reflections must be observed every 60 degrees along phi.

A phi scan is performed by rotating the sample 360 degrees, and observing the changes of intensity. My question is how to do this on a Discover D8 machine, what software to use, and how to integrate along phi?

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