Charge diffusion length in keskrite (CZTS) is variable, depending on many parameters such as anion/cation ratio. Is there any simple way to measure it for our synthesized CZTS NPs?
You can try by SSPG technique on CZTS film (on insulating substrate) or by EBIC technique on a CZTS solar cell (in cross section) or a recent method by IBM suitable to a whole CZTS device also; see Gokmen et al J Appl Phys 2013;114(11) 114511.
Apparently you can use time-resolved PL, provided CZTS luminesces and that a certain sample set can be prepared, see Stranks et al., Science 342 (6156): 341-344