I want to determine the doping type and doping level of the silicon wafer I have at the lab with a digital multimeter. I'm wondering if there is a simple way to do it.
I think it is not possible to find the doping type and level using digital multimeter. Usally, to measure doping concentration and type, Hall measurements are used. Because, to measure the doping type and concentration, you need to put magnetic field. Please read the Hall effect.
You can try measuring resistance with the multimeter but the result will be probably very inaccurate, due to the poor contact (metal-semiconductor junction), then you can calculate resistivity. If the wafer is uniformly doped, you can measure sheet resistivity using a four point probe setup, then you can calculate the bulk resistivity knowing the thickness. There are tables/graphs available that relative Si wafer resistivity to doping concentration. You can determine doping type from the wafer flats (see picture attached).