I am working with polycrystalline multiphase film. I have got HRTEM images of cross-section of this films. Does anybody know how to determine crystal plane indices (hkl) on HRTEM image?
HRTEM always requires actually an image simulation. But first you should read the basics.
David B. Williams: Transmission Electron Microscopy: A Textbook for Materials Science, http://www.amazon.de/Transmission-Electron-Microscopy-Textbook-Materials/dp/038776500X/ref=sr_1_fkmr0_1?ie=UTF8&qid=1374867518&sr=8-1-fkmr0&keywords=williams+Transmisission+electron
Then you can start the local FFT to index analogous to a diffraction pattern. If you do not have own software, the following website is useful.
http://emaps.mrl.uiuc.edu/emaps.asp
By calculating the distance between the lattice fringes, you can match this distance with the d-spacing value corresponding to different lattice planes in XRD. A perfect match with the d-spacing would give you the hkl value for that lattice fringes.
Good luck!
For calculating the difference between the lines from HRTEM, you can use different softwares e.g. Digital Micrograph or image J..
Good luck!
Would you also tell us where we can find d-spacing reference values to match them up with my measured values?
I am looking for d-spacing of diffrent planes in Al2O3 and TiB2 to match them with my calculated lattice fringes.
Very nice discussion.
I tried to match the measured values of d-spacing to the crystallographic data used in XRD, but the results was suprisingly too large.
If anyone kindly share your thoughts/experience in this matter.
You can make use of Digital Micrograph or image J. Better still, I think XRD is easy to handle that.
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