The IRF file contains the instrumental contributions to profile shape (gausian and lorentzian broadening, peak asymmetry, etc.) therefore you need to determine these parameters with a standard sample that does not introduce any peak broadening. Si powder is not the best standard material for that purpose (it is for zero point error and sample height determination since the cell parameter value is standarized).

To determine instrumental contributions to profile shape, LaB6 is the material that has been determined is best for (Bragg-Brentano) reflection geometry and NAC is the best for (Debye-Scherrer) transmission geometry, so be aware that your Si powder may introduce some broadening that may influence your microstructure analysis.

First download an dummy IRF file from internet. then edit it with ur instrumental parameters

The IRF file contains the instrumental contributions to profile shape (gausian and lorentzian broadening, peak asymmetry, etc.) therefore you need to determine these parameters with a standard sample that does not introduce any peak broadening. Si powder is not the best standard material for that purpose (it is for zero point error and sample height determination since the cell parameter value is standarized).

To determine instrumental contributions to profile shape, LaB6 is the material that has been determined is best for (Bragg-Brentano) reflection geometry and NAC is the best for (Debye-Scherrer) transmission geometry, so be aware that your Si powder may introduce some broadening that may influence your microstructure analysis.

if you know to refine a xrd pattern using fullprof software. can u help me in refining my XRD data.

what are the initial datas needed?

how to start with?

how to end with?

Hi Gokul Raja T S

for refining you need a CIF file and your XRD pattern.

there is manual in fullprof website.

if you need any thing specific, tell me.

good luck