It directly depends on the proper experiment design and execution.
As the X-ray intensity is based on the structural factor (the electron density of the probed sample fraction), it needs to be representative.
To be representative, particle size, distribution, and even the shape of particles are a concern and have to be taken into account.
By careful preparation, texture, preferred orientation, shape like planar polishment, some normalization is achieved in the scattering geometry overall surface.
A proper tube choice is crucial; it needs to be reliable. No presence of shinning as Fe does in high amount Fe samples when the diffraction is obtained with Cu tube. Otherwise, the result is an overexpressed amorphous phase.
Therefore, In high controlled sample preparation and measurement, as described above, the only illuminated center of your sample holder may have the behavior extrapolated, having a scattering fixed and representative phase volume of the probed phase(s).
Here we are talking about a simple mixture of crystallized and amorphous contributions of the same phase.
The higher number of different compounds in a phase mixture, the higher the inhomogeneity problem. It happens basically by their differences in density, in the atomic number Z, which may occur even into the two-phase mixture with variating final stoichiometry.
Therefore, to measure the volume fraction of a crystallized material in a mixture with an amorphous phase would only be reliable in careful measurement conditions, by direct comparison with the respective well-crystallized same constituent. Otherwise, the result may be considerer meaningless.
Thankyou @ Wagner Da Nova Mussel and Volker Kahlenberg for your answer.
I have annealed TiO2 thin film, initially at room temperature film was having amorphous behaviour but after the annealing it shows crystalline behaviour. So how should I know the volume fraction of crystallized material at particular temperature by diffraction peak.