When measuring the contact resistance using CTLM method, does the contact increase when the thickness of metal thin film increases twice?
The composition of metal is Ni/Au/Ni.
Rüdiger Mitdank
Dear Yerin,
the contact resistance between a metal and a semiconductor (usually referred to as Schottky barrier) only depends on the work function difference between both materials. Of course, the Ohmic resistance of the metallic layer must be added. This resistance depends on the layer thickness and enhances here indeed by a factor 2. Here, the influence of the surface on the resistance is not considered.
With regard
R. Mitdank
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