If i repeat a sample at different scanning rate on same instrument, then is there any chance that there will be a shift in peak positions or change in Intensity?
If you are recording XRD pattern of same materials using same diffractometer of same mounting, peak positions will not change with changing scan rate. However, intensity of the XRD data shows inverse behaviour to the scan rate.
If you are recording XRD pattern of same materials using same diffractometer of same mounting, peak positions will not change with changing scan rate. However, intensity of the XRD data shows inverse behaviour to the scan rate.
Exactly, that maybe happens when your materials not homogeneous. And if the scan step is very short, your result will be very soft with high intensity
Below article might be helpful.
Article Step size, scanning speed and shape of X-ray diffraction peak
Ideally (theoretically) Not. As this assumption in practice is never met, the answer is Yes. It basically depends on factors like instrumental errors and like uncertainties. For an introduction see the 1994 Wang paper cited above.
How much shift in position are we talking about ? If the diffracted peaks are weak and not sharp at a short scan rate, you can get approximate peak positions. Once the data is collected at a longer scan rate, you will see peaks at definitive positions. In terms of the intensities, you will get stronger signals at a longer scan rate; however, depending on the detector, you may saturate the signal (the top of the signal will be flat).
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