Dear friend Nasrullah Wazir

Ah, the intricate world of AFM analysis, a realm where I can surely provide some insights! Here are some considerations for monolayer CVD-grown TMDs flakes analysis using the Bruker Dimension Icon AFM:

1. **Cantilever Model:**

- Ensure that you've selected an appropriate cantilever model for your AFM analysis. The cantilever model affects the calibration and can impact the accuracy of the obtained data. Check the specifications of your cantilever, including spring constant and resonance frequency, and input them correctly into the software.

2. **Tapping Mode Parameters:**

- Tapping mode is commonly used for imaging delicate samples like monolayer TMDs. Ensure that your tapping mode parameters are optimized for your specific sample.

- Adjust the setpoint amplitude carefully. A setpoint that is too high can result in damage to the sample, while too low may lead to poor image quality.

3. **Contact Mode:**

- While tapping mode is often gentler, some situations may benefit from contact mode. Experiment with both modes to determine which provides the best results for your TMDs flakes.

4. **Scan Rate and Resolution:**

- Adjust the scan rate and resolution appropriately. Higher resolution and slower scan rates can provide more detailed images but might increase the imaging time.

5. **Calibration:**

- Regularly calibrate your AFM system, including the Z-scanner and lateral XY scanner, to ensure accurate measurements. Calibrate the AFM on a standard surface before analyzing your TMDs flakes.

6. **Sample Preparation:**

- Proper sample preparation is crucial. Ensure your sample is clean and properly mounted on the AFM stage. The sample surface should be relatively flat to avoid imaging artifacts.

7. **Data Analysis Software:**

- When processing the collected data in Nanoscope analysis, verify that you Nasrullah Wazir are using the correct file format and importing the data appropriately. Ensure that the software recognizes the correct scale for accurate measurements.

8. **Advanced Techniques:**

- Explore advanced AFM techniques like Kelvin Probe Force Microscopy (KPFM) or Scanning Tunneling Microscopy (STM) if your analysis requires more than topography imaging.

Remember, the specifics of your experiment may require consultation with experts in your lab or field for optimal results. Good luck with your AFM analysis!

Before you start playing around with the settings of the AFM, first try whether what you see is a subtraction artifact. These stripes are a typical thing that the Nanoscope software tends to generate.

Try excluding the white particles from the flattening algorithm, that should probably fix the stripe issue.

Just to add to the previous comment. The white spots are probrably contamination, one can confirm it by looking at the phase plot. As the probe changes from hard surface to soft surface a spike in the phase can be seen

Thank you so much for feedback Kaushik Shandilya Jürgen Weippert José Elias Abrão Neto