I agree with our colleague Pavar Sai Kumar. All these materials are well characterized in the literature. I advise you to do the following. Many typical diffraction patterns will be accessible for a specific crystal structure of a chemical or element in the data base. The conditions under which the diffraction data (JCPDS) of the samples were taken are also significant when trying to compare your own data with the standard one. The published data might be the most useful for comparison if your experimental conditions are similar. So you have to be careful.
Dr. Sharanabasava Vishwanath Ganachari you can try match 3 software which is available on internet in trail version which is valid for one month, you can get ICDD/JCPDS number for the corresponding XRD pattern, but due to license issue you cant access the database for the newer materials. But you can find the ICDD/JCPDS number for the very well known materials such as ZnO, TiO2 etc.,. But for further, rietlveld refinement or deeper analysis you need license, if not match with literature given JCPDS number at appropriate diffraction angles and cite the suitable papers is another option.