I am developing a code for data analysis of ellipsometry data. Please find attached the graphs of psi versus lambda and delta versus lambda. The delta graph is a good fit and psi graphs oscillations match. However the variation of amplitude of psi is the problem. Consider refractive index and thickness of film when changed leads to a mismatch of oscillations, I have no idea how to control the amplitude without effecting other parameters.
Can anyone help and suggest where I might be wrong?
Some more information needed to interpret the measurement curves. What model is used, what is the substrate etc. It looks that the film is not uniform, or is a little absorbing.
I used the Sellimier Model. The film is of tin sulphide on glass microscope slides with bottom surface made rough. Film roughness must be +/- 10-15nm
Dr. Lukas Strizik, did you add an answer to this question. Its not listed among the trail of answers
Dear Arun,
your spectroscopic measruement looks like you have more than 150 nm on top as sulfide layer.
What kind of ellipsometer did you use for it?
maybe you can send me the raw data and i try to model it.
As substrate you have glass? (you can model it with sellmeier) but for sulfor i would use another dispersion formula (maybe it absorbs some way)
Best regards
Christian
Dear Chrisitan,
Thanks for your mail. I'd get back to you with details. Please post your email id. Or mail me on [email protected] or [email protected]
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