I have recorded UV/Vis transmission spectrum of SiO2 thin film deposited on glass. I want to find the refractive index of the film. My transmission spectrum does not represent interference fringes with minima and maxima. Thanks.
Please follow this paper
https://www.sciencedirect.com/science/article/pii/S0925346713000906
Hi Chandra,
thanks for your answer, but as I mensioned, my transmission spectrum does not represent interference fringes with minima and maxima
If you don’t have the fringes it’s because of the inhomogeneity of your film as a consequence you can’t find the index.
Dear all,
I'm dealing with porous film. I think, that the reason why I don't have fringes is the thickness of the film which is about 200 nm. Any suggestions to find the refractive index?
Swanepoel method will definitely help you. There are multiple calculation steps. The attached paper will surely help you. Although for this method, fringes are mandatory. Have you checked from some characterization technique whether your film is uniform enough or not? As the fringes are generally obtained in uniform films. For knowing refractive index, you must try to deposit uniform film.
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