By constructed the interference set up used laser as the source
From measured the fring width B and the distance from the source to the screen D , as well as the known wave length of the laser(use cw-HeNe or any diod laser) you can find the d thickness of the film.
Thickness= (wave length x D)/ B
regards
Raad
I think, for example, SEM (or TSEM) is used to measure the average size of nanoparticles. However, I am not sure if it used to measure the Nano-thin film of the solar cell.
Regards.
Process dependent Maytham , say for solar panels of a particular panel the manufacturing stipulation based on design such as absorption / I-V/material say dopant and buffer layers etc etc give you a theoretical limit . This is then given a value by manufacturing process(s) .
https://www.filmetrics.com/solar-pv
https://www.tec5.com/adbimage/688/asset-original/an_39_tec5_thickness_measurements_solar_cells_e.pdf
https://www.drschenk.com/fileadmin/brochures/06-solar_inspection/brochure_solarmeasure_general.pdf
use Alpha-step but into glass substrates, put glass substrates in the same coating conditions that using on the surface of titanium,and then thicknesses of deposited coatings were determined by Alpha-step.
regards
By constructed the interference set up used laser as the source
From measured the fring width B and the distance from the source to the screen D , as well as the known wave length of the laser(use cw-HeNe or any diod laser) you can find the d thickness of the film.
Thickness= (wave length x D)/ B
regards
Raad
Dear Prof. Raad Sh. Alnayli, I appreciate your answer
Regards
Maytham
Dear Dr, Abdullah Hasan Jabbar , thanks for your answer
Maytham
dear
see this colud help you
https://www.researchgate.net/post/How_to_measure_the_thickness_of_nano_sized_coating
https://pdfs.semanticscholar.org/9b99/22e032cfec1093ca74864f15f90a87e07c06.pdf
https://cns.asu.edu/sites/default/files/library_files/lib_guoyporteraandhu.pdf
you can use Ellipsometry or SEM test for cross-section of your film then calculate the thickness.
Please see the attached documents about the methodologies of using the aforementioned technologies for measuring thin film thickness measurements.
Dear Dr. Raad
I think your idea useful during thin film deposition, I used it before to control the thickness of my film, you can check my paper.
It's very simple, please to take the cross section view of your sample via FESEM.. Then we can easily measured the thickness using image j software.
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