I am wondering if we can use TEM analysis as a direct evidence to know about the quality of a dispersion for example in case of graphene or carbon nanotube dispersion.
Using TEM/HETEM, surface morphology of graphene/reduced graphene oxide can be clearly seen including surface defect. But, the nanoparticles (NPs) dispersed on it can be well recognized and an excellent technique for the determination of dispersed NPs on the surface of graphene/reduced graphene oxide etc.
TEM will tell you about number of layers of your graphene, and size. If you deal with a dispersion on a surface, AFM is more suitable as you can do better statistics on a larger scale.
I understood that. But for TEM as for AFM analyses you cannot use the liquid phase directly. You have to spread your solution on a surface or membrane and dry it to look at the deposits.
Dear Dr Bouchiat you are right, but in fact this is my originally question. Can we use TEM image (which has been obtained in a dried form) as an evidence to speak about the quality of dispersion (solution form)?
the answer is yes (you dry the solution on a lacey carbon grid and look at the density, size, thickness of materials but as I said AFM is probably better suited for that analysis.
I am not sure that conventional TEM and AFM are suitable, because you need to dry the sample and it may be expected the sample in dry form to be different as compared to its liquid form.