Dear Morteza Azarbarmas,

Unfortunatelly, I am not familiar with Channel 5 software. The OIM TSL Analysis  5 software (this is the one that I use for my evaluations) allows an automatical generation of the GOS maps or charts. However, maybe Your programme have an option to export some information about "grain average misorientation" or " orientation spread" from acquired data sets? Please  be aware that there is a lot of other quantitative metrics that may be taken from the EBSD data and used for crystal strain assesment (e.g. GAM, KAM ).  I have also adopted the Image Quality (IQ) analysis to estimate deformed fraction in polycrystalline materials. You may find some details as well some usefull references in these articles:

https://www.researchgate.net/publication/272478927_Electron_Backscatter_Diffraction_Study_on_Microstructure_Texture_and_Strain_Evolution_in_Armco_Iron_Severely_Deformed_by_the_Differential_Speed_Rolling_Method

Evolution of crystallographic texture and strain in a fine-grained Ni3Al (Zr, B) intermetallic alloy during cold rolling

I wish You good luck

Wojciech

Article Electron Backscatter Diffraction Study on Microstructure, Te...

Dear Wojciech Polkowski

Thanks a lot for your useful answer. Is OIM TSL a free software?

Yes, In Channel 5 I can gain GAM (Grain Average Misorientation) automatically but in the case of GOS (Grain Orientation Spread) I can just have these tables:

     -Euler angles for all pixels (corresponding to x-y positions, not corresponding to each grain).

     -Average Euler angles and average miorientations of grains for whole structure.

     -In a selected grain (It means we should first select and save a grain alone as a new file) we can have a table containing Euler angles for all pixels as well as all misorientations between whole pixels in that grain.-->It is possible to calculate GOS for a selected grain.

For determining the fraction of recrystallized grains by GOS we should have GOS distribution for all grains in the structure so it is not possible by selecting and calculating it for each grain separately (because there are a lot of grains in structure).

The best way is to use MTEX, a free and open-source Matlab toolbox. in case you have specific problems (especially at the beginning) you can ask Ralf Hielscher to find a solution.

Alternatively I would recommend you to comntact the dealer who sold Channel5 to you. He should be able to anwser this question, or give you at least a contact person at Oxford Instr. who knows more about the currently available functions. I myself did not used this option but this does not mean that it doesn't exist.

GAM should also give you the answer on your question since GAM generate small values for recrystallized grains whereas for deformed grains GAM should be show higher values. 

I think that Mr. Nozle hit the point. Try to contact  the producer of software and conduct more detailed literature survey on using the GAM for the strain assessing. Generally, in this kind of analysis it is good to have some reference samples (e.g. a deformed, a partially and fully recrtystallized). Try to answer what is the difference between GAM distributions for these samples? Maybe You will find a value that may be attributted to recrtystallized grains. Kind regards!

Thank you  Gert and  Wojciech. MTEX seems to be excelent! I should try it. If it doesn't work good I should contact  the producer of my software.

Best Regards/Morteza

You can very easily obtain the GOS by using the manp component 'Internal statistic' and select the appropriate value to plot.

Hi David, which is the appropriate value of the GOS plot? 

Dear Morteza, I quickly went through our Channel 5.11 suite - which I normally do not use for my work simply because I am used to OIM Analysis from EDAX/TSL. There is a map parameter that might serve you needs called "Recrystallized fraction". When you look into the help file for its definition, you will find that it is based on grain orientation spread, although it won't give you the GOS chart and separate values, just three classes of grains - "deformed", "substructured" and "recrystallized" - the threshold for each being able to be defined in map properties.

However, upon reading David's answer, I have to agree that the closest resemblance of GOS parameter as I know would be achieved by selecting "Internal statistics" in "grain component" part of the map parameter list (if not displayed, you need to add it in "component manager"). When you pick "MAD" as source parameter and "mean" as the statistics for plotting, then you should obtain a map equal to GOS map as per definition in TSL software. The histogram is displayed in "legend" pane of the map.

Hope this will help you.

Thanks, Ondrej!

Dear Morteza Azarbarmas,

I do with MTEX, Here are the simple steps below,

[ref:http://mtex-toolbox.github.io/files/doc/EBSDTutorial.html]

{

[grains,ebsd.grainId] = calcGrains(ebsd('indexed'),'angle',10*degree);

figure

plot(grains,grains.GOS/degree)

}

%% note using the [colormapeditor] code you can restrict the GOS value to distinguish the deformed and recrystallized grains.

Hope it helps

Regards

Santosh

What's the meaning of degree in "plot(grains, grains.GOS/degree)"?

Of course you can. See the attached image

Hello Azarbarmas:

I'm searching the software channel 5, could you please send me a download link?