I have X-ray data of Germanium thin films. I have calculated grain size using Scherrer eq. I have prepared an article, but a referee said that my calculation is incorrect. Because I didn't eliminated instrumental broadening. How can I eliminate this effect?
Check this topic here in RG.
https://www.researchgate.net/post/How_to_determine_the_broadening_effect_factor_of_an_XRD_equipment_in_measuring_grain_size_of_materials
TOPAS incorporates broadening effects while applying scherrer Formula.
Shaban,
in your paper you say
"The two broad diffraction peaks obtained from the samples are readily indexed to diamond-like cubic Ge (JCPDS card No. 65-0333), "
but the image of you data in the XRD trace in your figure 1 shows a broad peak at 50 degrees 2-theta that does not match the positions of either of the (220) or (311) reflections on the JCPDS card. How is this peak readily indexed to the reference pattern?
- Badges
- Science method
- Similar topics
- Methodology
- Crystallography
- X-ray Diffraction
- XRD Analysis