I have synthesis 15 nm film on quartz substrate. I have used Receiving slit (in plane). Does it gives all peaks from plane normal to the incident beam or it will give all possible peak?
I always find difficult in selecting DS,SS,RS and ATT value selection. Here I attached the parameter file.
Dear Shreya,
I can't see any reason why GXRD should not be applicable to the tpye of films you mentioned above.
In the case of amorphous or polycrstalline sample there is no preferred orientation at all and you should see the approriate peaks. However the case of amorphous thin film on amorphous substrate is an experimental challenge even for grazing incidence XRD.
Textured/highly oriented or single crystalline samples will only give some of the peaks which normally pop up in the polycrystalline/powder case. Furthermore the relative peaks heights will differ from the polycrystalline/powder case too.
When using spinning samples there is no real difference in the peak behaviour compared to the non grazing incidence case.
From my point of view, 15nm is already a challenge. Of course it depends on the material investigated. For diffraction you need a certain amount of crystals with multiple unit cells in all directions. If your unite cell is small it is certainly possible. If not it turns out hat along specific directions the required lattice periodicity is lower than along other directions (anisotropic peak broadening). At 15 nm you perhaps have to deal with lattice mismatch at the interface and with relaxation perpendicular to the surface. Amorphous parts (probably only x-ray amorphous) are always negative for conventional diffraction and reduce the amound of diffracted signal drastically. This is especially disdvantagous when you already have a low signal and need to use gracing incidence.
"Does it gives all peaks from plane normal to the incident beam or it will give all possible peak?"
this sentence I do not really get...
Glacing incidence X-ray diffraction cannot be used for epitaxy or single-crystal films, since the geometry configuration of this technique does not permit the recording of the peaks. You should use conventional X-ray diffraction (Bragg-Brentano) geometry for detecting the crystalline phases of epitaxy and single-crystal films.
@Gerhard Martens, Thank you for your reply. I understand that GXRD of amorphous films on amorphous substrate is difficult but we got results with proper in plane arrangement. I have always concern about proper arrangement of optics so that I will not eliminate any peaks. Also, I believe textured films at GXRD will not give all possible in plane and out of plane with same optics. If i changed receiving slits to in plane then it will give me corresponding peaks and if I change receiving slits out of plane then it will give me peaks accordingly.
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