i doped nano particle in epoxy resin and want to study the percentage based charecterization .......so EDAX analysis is useful or not??(because epoxyresin is insulator)
if not than can anyone give the name of method by which i can find the propertion of added nanoparticle ....
Your probably meant SEM equipped with energy dispersive detector. You have to study several samples to get an average. Moeover, enegy dispersive detector is not sensitive fro carbon, so you cannot easily compare the filler content. The filler is probably ionrgainc with heavier elements, so you can use the method to check elemental distribution. But even in that case, due to the limited resolution of SEM you will probably see the agglomerates not the individual particles. I would suggest using some standard analytical methd, such as ICP analysis to determne the elemental distribution and from that you can calculate back the filler content. If your epoxy dioes not char, you may try to use TGA as well, although at low filler content it is not precise enough.
What do you mean with EDAX analysis? EDAX I only know as a company for analytical equipment.
Hi Sanket,
I dont think hat EDAX is going to help in this case. Well, I will recommend you to search for XPS and SIMS. I am no expert in these experiments, therefore I cannot give much information.
Any one who is an expert in this area, please help to correct me and also help Sanket.
Your probably meant SEM equipped with energy dispersive detector. You have to study several samples to get an average. Moeover, enegy dispersive detector is not sensitive fro carbon, so you cannot easily compare the filler content. The filler is probably ionrgainc with heavier elements, so you can use the method to check elemental distribution. But even in that case, due to the limited resolution of SEM you will probably see the agglomerates not the individual particles. I would suggest using some standard analytical methd, such as ICP analysis to determne the elemental distribution and from that you can calculate back the filler content. If your epoxy dioes not char, you may try to use TGA as well, although at low filler content it is not precise enough.
I fully agree with Gyorgy Banhegyi. Another possible way is ( provided the epoxy is transparent) make composites with different known fraction of nanoparticles and take the optical absorption spectra and then use the data for unknown volume fractions. Even XPS also requires calibration with known samples.
Dear colleagues, I would prefer if S. Thakor first give a feedback what does he really wants to know. EDAX is certainly no correct term so that any answer is only speculation. First we should try to express ourselves correctly. I am tired to interpret questions or don't get any response from the interrogator if something in his question is unclear. It is also possible to re-edit questions!
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