Can anyone give any convertion parameter so that I can grow the same film in PLD taking data for RF-Sputtering parameters provided targets and substrates are same or vice-versa.
Sputtering is normally done at very low chamber pressures
5 millTorr to 40 mTorr,
whereas PLD for oxide film deposition is done at relatively much higher pressures.
Hence it will be difficult to find really comparative studies, but there may be a few studies where must have tried to compare at similar pressures. A good literature survey should help you out.