I want to characterize the prepared crystal samples on the basis of XRD spectra. I have XRD spectra with me and I want to assign their (h,k,l) planes and also to match these spectras with their standard JCPDS no.
If you are dealing with known structures, X'Pert Highscore is OK for searching in a database of deposited structures, obviously if you have access to a database. Otherwise, if you deal with new phases, then you should index your patterns from scratch, fitting the profile and using the peak positions as input for an indexing program like TREOR or DICVOL, for example.
assigning h k l planes are not sufficient, you have to confirm crystal system and lattice parameters. Further, if necessary, positional parameters refinement by Rietveld refinement method using Fullprof suite program.
I suggest to use Fullprof and reitveld refinement. To the list of proposed programs for indexing (DICVOL and TREOR) you can try also FOX http://fox.vincefn.net/