Wedad A. Alwesabi

Peaks in XRD, FTIR, NMR, UV-VIS, XPS, Auger?

I think this article answers your question

https://iopscience.iop.org/article/10.1088/1757-899X/172/1/012036

Hi Wedad A. Alwesabi

From the origin you can plot the XRD of the analyzed sample. To identify the XRD peaks you have to tally the peak data with a standard JCPDS data file. Thus, you can identify the plans and hence the crystallite size, lattice parameter can be evaluated using Scherrer formula. As you are working on CuO/ZnO nanoparticles you can investigate the JCPDS files of CuO, ZnO, or copper-zine mixed oxide materials.

I can say the above from the best of my knowledge.

Regards

thanks a lot

Arnab Mukherjee

Ilham Ben Amor thank you

Dear you can match the peak of your samples with match software. Best wishes

Choose well-defined identical peaks from the XRD data. then compare this with JCPDS Card. you may use match software to identify the plane. or search cuo/zno NCP xrd curve , you will find previously published paper in this topics, those data may also help you.